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1. Yavor M.I., Verenchikov A.N. [Comparative analysis of multipass time-of-flight mass analyzers based on mirrors and sector fields]. Nauchnoe Priborostroenie [Scientific Instrumentation], 2006, vol. 16, no. 3, pp. 21–29. URL: http://213.170.69.26/mag/2006/abst3.php#abst2. (In Russ.).
2. Toyoda M., Okumura D., Ishihara M., Katakuse I. Multi-turn time-of-flight mass spectrometers with electrostatic sectors. J. Mass Spectrom., 2003, vol. 38, no. 11, pp. 1125–1142. Doi: 10.1002/jms.546.
3. Satoh T., Tsuno H., Iwanaga M., Kammei Y. The design and characteristic features of a new time-of-flight mass spectrometer with a spiral ion trajectory. J. Am. Soc. Mass Spectrom., 2005, vol. 16, pp. 1969–1975. Doi: 10.1016/j.jasms.2005.08.005.
4. Yavor M., Verentchikov A., Hasin Ju., Kozlov B., Ga-vrik M., Trufanov A. Planar multi-reflecting time-of-flight mass analyzer with a jig-saw ion path. Physics Procedia, 2008, vol. 1, no. 1, pp. 391–400.
5. Verenchikov A., Yavor M. Mass analyzer having ex-tended flight path. Patent PCT WO2018033494, 2018.
6. Yavor M. Optics of charged particle analyzers. Acad. Press, Amsterdam, 2009.
7. Wollnik H., Harmann B., Berz M. Principles of GIOS and COSY. AIP Conf. Proc., 1988, vol. 177, pp. 74–85. Doi: 10.1063/1.37817.
8. Manura D.J., Dahl D.A. SIMIONTM 8.0 User Manual. Sci. Instrument Services, Inc., Idaho Nat. Lab., 2006.
9. Verenchikov A., Kirillov S., Khasin Yu., Makarov V., Yavor M., Artaev V. Multiplexing in multi-reflecting TOF MS. J. Applied Solution Chemistry and Modeling, 2017, vol. 6, pp. 1–22.