Multiturn spiral time-of-flight mass analyzer based on cylindrical sector fields and periodic lenses

 
PIIS086858860001100-2-1
DOI10.31857/S086858860001100-2
Publication type Article
Status Published
Authors
Affiliation: Institute for Analytical Instrumentation of RAS
Address: Russian Federation, Saint-Petersburg
Affiliation: MSC-CG D.O.O., Bar
Address: Montenegro
Affiliation: Peter the Great Polytechnical University
Address: Russian Federation
Journal nameNauchnoe priborostroenie
EditionVolume 28 Issue 3
Pages84-89
Abstract

Based on numerical simulation investigated is a possibility to use in multiturn sector time-of-flight mass ana-lyzers with spiral ion motion of an array of periodic lenses, similar to used in mirror multireflecting time-of-flight analyzers. It is shown that this solution retains the resolving power of the mass analysis while considera-bly simplifying the design of the device because of using cylindrical sector fields and adding a possibility to double ion flight path length with the aid of reflecting ions in the direction of the spiral drift.

Keywordstime-of-flight mass analyzer, periodic lenses, cylindrical deflector, resolving power, flight time focusing
Received09.10.2018
Publication date10.10.2018
Number of characters567
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1. Yavor M.I., Verenchikov A.N. [Comparative analysis of multipass time-of-flight mass analyzers based on mirrors and sector fields]. Nauchnoe Priborostroenie [Scientific Instrumentation], 2006, vol. 16, no. 3, pp. 21–29. URL: http://213.170.69.26/mag/2006/abst3.php#abst2. (In Russ.).

2. Toyoda M., Okumura D., Ishihara M., Katakuse I. Multi-turn time-of-flight mass spectrometers with electrostatic sectors. J. Mass Spectrom., 2003, vol. 38, no. 11, pp. 1125–1142. Doi: 10.1002/jms.546.

3. Satoh T., Tsuno H., Iwanaga M., Kammei Y. The design and characteristic features of a new time-of-flight mass spectrometer with a spiral ion trajectory. J. Am. Soc. Mass Spectrom., 2005, vol. 16, pp. 1969–1975. Doi: 10.1016/j.jasms.2005.08.005.

4. Yavor M., Verentchikov A., Hasin Ju., Kozlov B., Ga-vrik M., Trufanov A. Planar multi-reflecting time-of-flight mass analyzer with a jig-saw ion path. Physics Procedia, 2008, vol. 1, no. 1, pp. 391–400.

5. Verenchikov A., Yavor M. Mass analyzer having ex-tended flight path. Patent PCT WO2018033494, 2018.

6. Yavor M. Optics of charged particle analyzers. Acad. Press, Amsterdam, 2009.

7. Wollnik H., Harmann B., Berz M. Principles of GIOS and COSY. AIP Conf. Proc., 1988, vol. 177, pp. 74–85. Doi: 10.1063/1.37817.

8. Manura D.J., Dahl D.A. SIMIONTM 8.0 User Manual. Sci. Instrument Services, Inc., Idaho Nat. Lab., 2006.

9. Verenchikov A., Kirillov S., Khasin Yu., Makarov V., Yavor M., Artaev V. Multiplexing in multi-reflecting TOF MS. J. Applied Solution Chemistry and Modeling, 2017, vol. 6, pp. 1–22.

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